Lab's Equipment List
- JEOL JSM 6700F SEM
- JEOL JSM 6390LA SEM
- JEOL JEM 3010 TEM
- Asylum Research MFP-3D AFM
- Zeiss LSM 510 Meta Confocal Microscope
- Zeiss TIRF Microscope
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JEOL JSM 6701F SEM
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JFC-1600 Auto Fine Coater
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Key features of JSM 6701F SEM
- High resolution of secondary electron image (SEI)
1.0 nm at
- accelerating voltage 15 kV; 2.2 nm at accelerating voltage 1 kV
- High magnification x100 (WD 25 mm) to x650,000
(WD 8 mm)
- Accelerating voltage 0.5 to 30 kV
- Probe current order of 10-13 to 2 x 10-9 A
- Automated electron optics
- Electron gun field emission gun with cold cathode
- Emission current 2, 5, 10, 20 uA; usually 10 uA
- High stability large eucentric specimen stage with
motorized control
- X-axis 70 mm; Y-axis 50 mm; Z-axis 25 mm; Rotation 360o; Tilt -5o to +60o Liquid N2 cold trap
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Oxford EDS
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Key features of Oxford EDS
- X-Max Silicon Drift Detector (SDD)
- Single sensor with 50 mm2 large active area
- Liquid N2 free analysis
- Vacuum enclosed sensor
- Motorized slide control
- High speed
- High counts > 500,000 cps
- Throughput > 200,000 cps
- Short analysis time
- High accuracy
Location: N1.2-B5-10
Contact email: WangXj@ntu,edu.sg
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JEOL JSM 6700F SEM
JED 2300 EDS |
BSE |
Key features of JSM 6700F SEM
- High resolution of secondary electron image (SEI) 1.0 nm at accelerating voltage 15 kV; 2.2 nm at accelerating voltage 1 kV
- High magnification x100 (WD 25 mm) to x650,000 (WD 8 mm)
- Accelerating voltage 0.5 to 30 kV
- Backscattered Electron (BSE) mode with a retractable solid state BSE detector
- Scanning Transmission Electron detector (STEM) with resolution better than 1 nm at highest accelerating voltage of 30 kV
- JED 2300 Energy Dispersive X-ray Analyser (EDS) offering seamless observation and micro-analysis
- Liquid N2 cold trap
Location: N1.3-B3-19a
Contact email: SCYu@ntu.edu.sg |
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JEOL JSM 6390LA SEM
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Key features JEOL JSM 6390LA SEM
- With HV mode and LV mode
- Equipped with secondary-electron detector and backscattered-electron detector
- Resolution of secondary electron image (SEI) 3.0 nm at accelerating voltage 30 kV; 8.0 nm at accelerating voltage 3 kV; 15.0 nm at accelerating voltage 1 kV
- Magnification x5 (WD 48 mm) to x300,000 (WD 8 mm)
- Automatically corrected for accelerating voltage and WD changes
- Probe current 1 pA to 1 uA
- Fully automatic system control
- Ultimate pressure in gun chamber 0.1 mPa order at HV mode; 1 mPa order at LV mode
- X-axis 80 mm; Y-axis 40 mm; Z-axis 48 mm; Rotation 360o ; Tilt -10o to +90o
- Specimen holder 10 mm diameter x 10 mmH and 32 mm diameter x 10 mmH
Location: N1.2-B5-10
Contact email: WangXJ@ntu.edu.sg |
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JEM 3010 TEM
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Key features JEOL JEM 3010 TEM
- Accelerating Voltage 300 kV
- Magnification 4000x to 1200000x
- Electron gun LaB6 filament
- With condenser aperture, objective aperture and field limiting aperture
- OL polepiece HRP
- Polepiece lattice resolution 0.143 nm; point resolution 0.19 nm
- With 5 spot sizes and 3 a angles
- With Gatan GIF 200 camera
Location: N1.2-B5-10
Contact email: WangXJ@ntu.edu.sg
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MFP-3D AFM
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Key features Asylum Research MFP-3D AFM
- Mounted onto a baseplate with XY scanner which sits on an inverted optical microscope frame
- With an anti-vibration hood installed
- Operating modes: contact mode, AC mode and force mode
- Scan Axes: X&Y 90 μm travel in closed loop, closed loop position control with sensor noise < 0.5 nm average deviation (Adev) in a 0.1 Hz-1 kHz bandwidth (BW) and sensor non-linearity < 0.5% (max deviation/full travel) at full scan
- Z >15 μm sensored travel, sensor noise < 0.25 nm Adev in a 0.1 Hz-1 kHz BW and sensor non-linearity < 0.05%
- Z height: noise < 0.06 nm Adev, 0.1 Hz-1 kHz BW
- Optical Lever: noise < 0.02 nm Adev in a 0.1 Hz to 1 kHz BW
Location: N1.2-B5-10
Contact email: WangXJ@ntu.edu.sg
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Zeiss LSM 510 Confocal Microscope
Key features of Zeiss LSM 510 Confocal Microscope
- VIS Laser Module: Ar laser (458, 477, 488, 514 nm) 30 mW, HeNe laser (543 nm) 1 mW, and HeNe laser (633 nm) 5 mW
- Scanner: Two independent galvanometric scanning mirrors, real-time controlled, with ultrashort line and frame flyback
- Scan resolution: 4x1 to 2048x2048 pixels, also for several channels, continuously variable
- Scanning speed: 13 x 2 speed stages; up to 5 frames/s with 512x512 pixels
- Objectives: 10X , 20X, 40X oil, 63X Oil
- Scan field: 18 mm field diagonal (max.) in the intermediate image plane, homogeneous field illumination
- Z Drive: Motor with optoelectronic coding, smallest increment ≤ 50 nm
- Pinholes: Pre-adjusted pinholes, individual variation of size and position for each reflected-light channel
- Detection: Simultaneous for up to four confocal reflected-light channels, each with a highly sensitive photomultiplier; META detector for fast acquisition of lambda stacks with up to 32 channels in 1.2 s;
- Data depth: 8 or 12 bits, individual 12- bit A/D converted for each channel
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Zeiss TIRF Microscop
Key features of Zeiss TIRF Microscope
- Lasers: TIRF multiline Argon-laser 458, 488, 514 nm
- Objectives: 10X , 20X, 40X oil, 63X oil and 100X oil
- TIRF-slider: Manual version I
- With incubator
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Location: N1.3-B3-19b
Contact email: SCYu@ntu.edu.sg |
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FTA 200 Contact Angle Analyzer |
 ZEISS Axiovert 200 Fluorescence Microscope |
Key features of FTA 200 Contact Angle Analyzer
- Measuring contact angle
- Measuring surface and interfacial tensions
- Measuring wettability and absorption
- Computer controlled syringe pump
- Computer controlled lighting Adjustable specimen stage
Location: N1.2-B1-33
Contact email: WangXJ@ntu.edu.sg |
