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Atomic & Nano Imaging and Microscopes


Lab's Equipment List

  1. JEOL JSM 6700F SEM
  2. JEOL JSM 6390LA SEM
  3. JEOL JEM 3010 TEM
  4. Asylum Research MFP-3D AFM
  5. Zeiss LSM 510 Meta Confocal Microscope
  6. Zeiss TIRF Microscope

JEOL JSM 6701F SEM

JFC-1600 Auto Fine Coater
Key features of JSM 6701F SEM

  • High resolution of secondary electron image (SEI)
    1.0 nm at
  • accelerating voltage 15 kV; 2.2 nm at accelerating voltage 1 kV
  • High magnification x100 (WD 25 mm) to x650,000
    (WD 8 mm)
  • Accelerating voltage 0.5 to 30 kV
  • Probe current order of 10-13 to 2 x 10-9 A
  • Automated electron optics
  • Electron gun field emission gun with cold cathode
  • Emission current 2, 5, 10, 20 uA; usually 10 uA
  • High stability large eucentric specimen stage with
    motorized control
  • X-axis 70 mm; Y-axis 50 mm; Z-axis 25 mm; Rotation 360o; Tilt -5o to +60o Liquid N2 cold trap


Oxford EDS

Key features of Oxford EDS
  • X-Max Silicon Drift Detector (SDD)
  • Single sensor with 50 mm2 large active area
  • Liquid N2 free analysis
  • Vacuum enclosed sensor
  • Motorized slide control
  • High speed
  • High counts > 500,000 cps
  • Throughput > 200,000 cps
  • Short analysis time
  • High accuracy

Location: N1.2-B5-10
Contact email: WangXj@ntu,edu.sg

JEOL JSM 6700F SEM
JED 2300 EDS
BSE
Key features of JSM 6700F SEM

  • High resolution of secondary electron image (SEI) 1.0 nm at accelerating voltage 15 kV; 2.2 nm at accelerating voltage 1 kV
  • High magnification x100 (WD 25 mm) to x650,000 (WD 8 mm)
  • Accelerating voltage 0.5 to 30 kV
  • Backscattered Electron (BSE) mode with a retractable solid state BSE detector
  • Scanning Transmission Electron detector (STEM) with resolution better than 1 nm at highest accelerating voltage of 30 kV
  • JED 2300 Energy Dispersive X-ray Analyser (EDS) offering seamless observation and micro-analysis
  • Liquid N2 cold trap

Location: N1.3-B3-19a
Contact email: SCYu@ntu.edu.sg
JEOL JSM 6390LA SEM
Key features JEOL JSM 6390LA SEM
  • With HV mode and LV mode
  • Equipped with secondary-electron detector and backscattered-electron detector
  • Resolution of secondary electron image (SEI) 3.0 nm at accelerating voltage 30 kV; 8.0 nm at accelerating voltage 3 kV; 15.0 nm at accelerating voltage 1 kV
  • Magnification x5 (WD 48 mm) to x300,000 (WD 8 mm)
  • Automatically corrected for accelerating voltage and WD changes
  • Probe current 1 pA to 1 uA
  • Fully automatic system control
  • Ultimate pressure in gun chamber 0.1 mPa order at HV mode; 1 mPa order at LV mode
  • X-axis 80 mm; Y-axis 40 mm; Z-axis 48 mm; Rotation 360o ; Tilt -10o to +90o
  • Specimen holder 10 mm diameter x 10 mmH and 32 mm diameter x 10 mmH

Location: N1.2-B5-10
Contact email: WangXJ@ntu.edu.sg
JEM 3010 TEM

Key features JEOL JEM 3010 TEM

  • Accelerating Voltage 300 kV
  • Magnification 4000x to 1200000x
  • Electron gun LaB6 filament
  • With condenser aperture, objective aperture and field limiting aperture
  • OL polepiece HRP
  • Polepiece lattice resolution 0.143 nm; point resolution 0.19 nm
  • With 5 spot sizes and 3 a angles
  • With Gatan GIF 200 camera

Location: N1.2-B5-10
Contact email: WangXJ@ntu.edu.sg
MFP-3D AFM

Key features Asylum Research MFP-3D AFM

  • Mounted onto a baseplate with XY scanner which sits on an inverted optical microscope frame
  • With an anti-vibration hood installed
  • Operating modes: contact mode, AC mode and force mode
  • Scan Axes: X&Y 90 μm travel in closed loop, closed loop position control with sensor noise < 0.5 nm average deviation (Adev) in a 0.1 Hz-1 kHz bandwidth (BW) and sensor non-linearity < 0.5% (max deviation/full travel) at full scan
  • Z >15 μm sensored travel, sensor noise < 0.25 nm Adev in a 0.1 Hz-1 kHz BW and sensor non-linearity < 0.05%
  • Z height: noise < 0.06 nm Adev, 0.1 Hz-1 kHz BW
  • Optical Lever: noise < 0.02 nm Adev in a 0.1 Hz to 1 kHz BW

Location: N1.2-B5-10
Contact email: WangXJ@ntu.edu.sg

Zeiss LSM 510 Confocal Microscope

Key features of Zeiss LSM 510 Confocal Microscope
  • VIS Laser Module: Ar laser (458, 477, 488, 514 nm) 30 mW, HeNe laser (543 nm) 1 mW, and HeNe laser (633 nm) 5 mW
  • Scanner: Two independent galvanometric scanning mirrors, real-time controlled, with ultrashort line and frame flyback
  • Scan resolution: 4x1 to 2048x2048 pixels, also for several channels, continuously variable
  • Scanning speed: 13 x 2 speed stages; up to 5 frames/s with 512x512 pixels
  • Objectives: 10X , 20X, 40X oil, 63X Oil
  • Scan field: 18 mm field diagonal (max.) in the intermediate image plane, homogeneous field illumination
  • Z Drive: Motor with optoelectronic coding, smallest increment ≤ 50 nm
  • Pinholes: Pre-adjusted pinholes, individual variation of size and position for each reflected-light channel
  • Detection: Simultaneous for up to four confocal reflected-light channels, each with a highly sensitive photomultiplier; META detector for fast acquisition of lambda stacks with up to 32 channels in 1.2 s;
  • Data depth: 8 or 12 bits, individual 12- bit A/D converted for each channel

Zeiss TIRF Microscop

Key features of Zeiss TIRF Microscope
  • Lasers: TIRF multiline Argon-laser 458, 488, 514 nm
  • Objectives: 10X , 20X, 40X oil, 63X oil and 100X oil
  • TIRF-slider: Manual version I
  • With incubator
Location: N1.3-B3-19b
Contact email: SCYu@ntu.edu.sg
FTA 200 Contact Angle Analyzer
ZEISS Axiovert 200 Fluorescence Microscope
Key features of FTA 200 Contact Angle Analyzer
  • Measuring contact angle
  • Measuring surface and interfacial tensions
  • Measuring wettability and absorption
  • Computer controlled syringe pump
  • Computer controlled lighting Adjustable specimen stage

Location: N1.2-B1-33
Contact email: WangXJ@ntu.edu.sg